High-angular resolution electron backscatter diffraction data (HR-EBSD) from olivine and quartz
Cite as:
Wallis, David; Hansen, Lars; Britton, Ben; Wilkinson, Angus (2019): High-angular resolution electron backscatter diffraction data (HR-EBSD) from olivine and quartz. GFZ Data Services. https://doi.org/10.5880/fidgeo.2019.023
Status
I N R E V I E W : Wallis, David; Hansen, Lars; Britton, Ben; Wilkinson, Angus (2019): High-angular resolution electron backscatter diffraction data (HR-EBSD) from olivine and quartz. GFZ Data Services. https://doi.org/10.5880/fidgeo.2019.023
Abstract
This dataset is supplemental to the paper Wallis et al. (2019) and contains data derived from distortion of crystal lattices measured using conventional electron backscatter diffraction (EBSD) and high-angular resolution electron backscatter diffraction (HR-EBSD). The datasets include lattice misorientation, elastic-strain heterogeneity, residual-stress heterogeneity, and densities of geometrically necessary dislocations in olivine and quartz. We intend the data and associated paper to demonstrate key aspects of the HR-EBSD technique and to draw comparisons with conventional EBSD. As the paper by Wallis et al. (2019) is a review paper, several of the datasets have also been present in, or are otherwise related to, additional previous publications listed below .
Data are provided as 55 tab delimited .txt files organised by the figure in which they appear within Wallis et al. (2019). Data types are indicated in the file names. Please consult the data description file for detailed explanations.
Methods
The data were acquired on an FEI Quanta 650 field emission gun SEM equipped with an Oxford Instruments AZtec EBSD system and NordlysNano EBSD detector in the Department of Earth Sciences, University of Oxford. Reference frames for data acquisition and processing were validated following the approach of Britton et al. (2016). The pattern centre was determined prior to each run using an automated camera stepping routine in the acquisition software, implementing a process similar to that proposed by Maurice et al. (2011). Shifts in the pattern centre due to beam scanning were calibrated on an undeformed single crystal Si standard (Wallis et al., 2016; Wilkinson et al., 2006). All data sets were collected at the full resolution of the EBSD detector giving diffraction patterns of 1,344 × 1,024 pixels. All data sets were processed using 100 ROIs of 256 × 256 pixels and the robust iterative fitting and pattern remapping approaches of Britton and Wilkinson (2011, 2012). Data points were filtered out if they had either a mean angular error > 0.004 radians in the deformation gradient tensor or a normalized peak height < 0.3 in the cross‐correlation function (Britton & Wilkinson, 2011). Additional details of the data sets are presented in Table 1 of Wallis et al. (2019) and in the data description file.
Authors
Wallis, David;Utrecht University, Utrecht, The Netherlands
Hansen, Lars;University of Minnesota-Twin Cities, Minneapolis, US
CharacterString: This dataset is supplemental to the paper Wallis et al. (2019) and contains data derived from distortion of crystal lattices measured using conventional electron backscatter diffraction (EBSD) and high-angular resolution electron backscatter diffraction (HR-EBSD). The datasets include lattice misorientation, elastic-strain heterogeneity, residual-stress heterogeneity, and densities of geometrically necessary dislocations in olivine and quartz. We intend the data and associated paper to demonstrate key aspects of the HR-EBSD technique and to draw comparisons with conventional EBSD. As the paper by Wallis et al. (2019) is a review paper, several of the datasets have also been present in, or are otherwise related to, additional previous publications listed below .
Data are provided as 55 tab delimited .txt files organised by the figure in which they appear within Wallis et al. (2019). Data types are indicated in the file names. Please consult the data description file for detailed explanations.
CI_OnLineFunctionCode (codeList=http://www.isotc211.org/2005/resources/Codelist/gmxCodelists.xml#CI_OnLineFunctionCode codeListValue=http://www.isotc211.org/2005/resources/Codelist/gmxCodelists.xml#CI_OnLineFunctionCode_information): information
CharacterString: The data were acquired on an FEI Quanta 650 field emission gun SEM equipped with an Oxford Instruments AZtec EBSD system and NordlysNano EBSD detector in the Department of Earth Sciences, University of Oxford. Reference frames for data acquisition and processing were validated following the approach of Britton et al. (2016). The pattern centre was determined prior to each run using an automated camera stepping routine in the acquisition software, implementing a process similar to that proposed by Maurice et al. (2011). Shifts in the pattern centre due to beam scanning were calibrated on an undeformed single crystal Si standard (Wallis et al., 2016; Wilkinson et al., 2006). All data sets were collected at the full resolution of the EBSD detector giving diffraction patterns of 1,344 × 1,024 pixels. All data sets were processed using 100 ROIs of 256 × 256 pixels and the robust iterative fitting and pattern remapping approaches of Britton and Wilkinson (2011, 2012). Data points were filtered out if they had either a mean angular error > 0.004 radians in the deformation gradient tensor or a normalized peak height < 0.3 in the cross‐correlation function (Britton & Wilkinson, 2011). Additional details of the data sets are presented in Table 1 of Wallis et al. (2019) and in the data description file.
Released
Dataset
Abstract
;Utrecht University, Utrecht, The Netherlands
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